Search

Author/Creator Carter, Jared J.

1. The relation of electrical conductivity profiles and modulus data using the example of STO:Fe single crystals: A path to improve the model of resistance degradation. (15th September 2016)

Authors:
Bayer, Thorsten J.M.; Wang, Jian-Jun; Carter, Jared J.; Moballegh, Ali; Baker, Jonathon; Irving, Douglas L.; Dickey, Elizabeth C.; Chen, Long-Qing; Randall, Clive A.
Journal:
Acta materialia
Issue:
Volume 117(2016)
Page Start:
252
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

2. The relation of electrical conductivity profiles and modulus data using the example of STO:Fe single crystals: A path to improve the model of resistance degradation. (15th September 2016)

Authors:
Bayer, Thorsten J.M.; Wang, Jian-Jun; Carter, Jared J.; Moballegh, Ali; Baker, Jonathon; Irving, Douglas L.; Dickey, Elizabeth C.; Chen, Long-Qing; Randall, Clive A.
Journal:
Acta materialia
Issue:
Volume 117(2016)
Page Start:
252
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

Limit your search