Author/Creator: Carta, R. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Carta, R.

1. Sample Canister Capture Mechanism for Mars Sample Return: Functional and environmental test of the elegant breadboard model. (December 2015)

Authors:: Carta, R.; Filippetto, D.; Lavagna, M.; Mailland, F.; Falkner, P.; Larranaga, J.
Journal:: Acta astronautica
Issue:: Volume 117(2015)
Page Start:: 99
Record Type:: Journal Article
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2. 200 V Fast Recovery Epitaxial Diode with superior ESD capability. (September 2016)

Authors:: Irace, A.; Maresca, L.; Mirone, P.; Riccio, M.; Breglio, G.; Bellemo, L.; Carta, R.; Naretto, M.; El Baradai, N.; Para, I.; Di Santo, N.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 440
Record Type:: Journal Article
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3. BRENTUXIMAB-BENDAMUSTINE IN CHILDREN, ADOLESCENT AND YOUNG ADULTS WITH RELAPSED/REFRACTORY ANAPLASTIC LARGE CELL LYMPHOMA. (October 2022)

Authors:: Vinti, L.; Lucarelli, B.; De Vito, R.; Tangari, F.; Mussolin, L.; Girardi, K.; Carta, R.; Locatelli, F.
Journal:: Leukemia research
Issue:: Volume 121(2022)Supplement
Page Start:: S65
Record Type:: Journal Article
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4. High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices. (September 2019)

Authors:: Cimmino, D.; Busca, R.; Ferrero, S.; Pirri, F.; Richieri, G.; Carta, R.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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5. 200 V Fast Recovery Epitaxial Diode with superior ESD capability. (September 2016)

Authors:: Irace, A.; Maresca, L.; Mirone, P.; Riccio, M.; Breglio, G.; Bellemo, L.; Carta, R.; Naretto, M.; El Baradai, N.; Para, I.; Di Santo, N.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 440
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗