Author/Creator: Caria, Alessandro - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Caria, Alessandro

1. Defects and Reliability of GaN‐Based LEDs: Review and Perspectives. Issue 8 (24th February 2022)

Authors:: Buffolo, Matteo; Caria, Alessandro; Piva, Francesco; Roccato, Nicola; Casu, Claudia; De Santi, Carlo; Trivellin, Nicola; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Journal:: Physica status solidi
Issue:: Volume 219:Issue 8(2022)
Page Start:: n/a
Record Type:: Journal Article
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2. Electrical, optical characterization and degradation of Cu(InGa)Se2 devices with fluorine-doped tin oxide back contact. (November 2021)

Authors:: Bertoncello, Matteo; Barbato, Marco; Caria, Alessandro; Buffolo, Matteo; De Santi, Carlo; Rampino, Stefano; Vogrig, Daniele; Meneghesso, Gaudenzio; Meneghini, Matteo
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
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Record Type:: Journal Article
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3. Evidence of optically induced degradation in gallium nitride optoelectronic devices. (12th October 2018)

Authors:: De Santi, Carlo; Caria, Alessandro; Renso, Nicola; Dogmus, Ezgi; Zegaoui, Malek; Medjdoub, Farid; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Journal:: Applied physics express
Issue:: Volume 11:Number 11(2018)
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Record Type:: Journal Article
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4. Role of p-GaN layer thickness in the degradation of InGaN-GaN MQW solar cells under 405 nm laser excitation. (November 2022)

Authors:: Nicoletto, Marco; Caria, Alessandro; De Santi, Carlo; Buffolo, Matteo; Huang, Xuanqi; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Journal:: Microelectronics and reliability
Issue:: Volume 138(2022)
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Record Type:: Journal Article
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