1. Interface Capture Effect Printing Atomic‐Thick 2D Semiconductor Thin Films. Issue 49 (26th October 2022) Authors: Li, Lihong; Yu, Xiaoxia; Lin, Zhaoyang; Cai, Zhenren; Cao, Yawei; Kong, Wei; Xiang, Zhongyuan; Gu, Zhengkun; Xing, Xianran; Duan, Xiangfeng; Song, Yanlin Journal: Advanced materials Issue: Volume 34:Issue 49(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗