1. Process fault detection based on dynamic kernel slow feature analysis. (January 2015) Authors: Zhang, Ni; Tian, Xuemin; Cai, Lianfang; Deng, Xiaogang Journal: Computers & electrical engineering Issue: Volume 41(2015) Page Start: 9 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗