1. (Invited) Intrinsic Reliability Assessment of 650V Rated AlGaN/GaN Based Power Devices: An Industry Perspective. (4th May 2016) Authors: Moens, Peter; Banerjee, Abhishek; Constant, Aurore; Coppens, Peter; Caesar, Markus; Li, Zilan; Vandeweghe, Steven; Declercq, Frederick; Padmanabhan, Balaji; Jeon, Woochul; Guo, Jia; Salih, Ali; Tack, Marnix; Meneghini, Matteo; Dalcanale, Stefano; Tajilli, A; Meneghesso, Gaudenzio; Zanoni, Enrico;... Journal: ECS transactions Issue: Volume 72:Number 4(2016) Page Start: 65 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗