1. Measurement of Grain Boundary Properties in Cu(ln, Ga)Se2 Thin Films. (8th May 2018) Authors: Rozeveld, S.; Reinhardt, C.; Bykov, E.; Wall, A. Journal: Microscopy today Issue: Volume 26:Number 3(2018) Page Start: 32 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗