1. Correlative Tomography - Bridging the length-scales through correlative X-ray and Electron Imaging. (August 2021) Authors: Withers, Philip; Donoghue, Jack; Burnett, Timothy Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 932 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Low Energy 500 eV Focused Argon Ion Beam Provided by Multi-Ions Species Plasma FIB for Material Science Sample Preparations. (August 2021) Authors: Jiao, Chengge; Graham, Jeremy; Xu, Xu; Burnett, Timothy; van Leer, Brandon Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 20 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Nanoscale orientation mapping made easy: a new sample preparation workflow for rapid, large-area TKD analysis. (August 2021) Authors: Trimby, Pat; Anderson, Iain; Lindsay, John; Gholinia, Ali; Burnett, Timothy; Withers, Philip Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1596 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Observing the evolution of fatigue damage and associated strain fields in a correlative, multiscale 3D time-lapse study of quasi-unidirectional glass fibre composites. Issue 1 (October 2020) Authors: Prajapati, Anuj; Chirazi, Ali; Mikkelsen, Lars P.; Burnett, Timothy; Withers, Philip J. Journal: IOP conference series Issue: Volume 942:Issue 1(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Observing the evolution of fatigue damage and associated strain fields in a correlative, multiscale 3D time-lapse study of quasi-unidirectional glass fibre composites. Issue 1 (October 2020) Authors: Prajapati, Anuj; Chirazi, Ali; Mikkelsen, Lars P.; Burnett, Timothy; Withers, Philip J. Journal: IOP conference series Issue: Volume 942:Issue 1(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications. (August 2020) Authors: Jiao, Chengge; Xu, Xu; Burnett, Timothy; Dutka, Mikhail; Wall, David; van Leer, Brandon Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 408 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗