1. Characterization of sputtered hafnium thin films for high quality factor microwave kinetic inductance detectors. (26th May 2020) Authors: Coiffard, G; Daal, M; Zobrist, N; Swimmer, N; Steiger, S; Bumble, B; Mazin, B A Journal: Superconductor science & technology Issue: Volume 33:Number 7(2020:Jul.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗