1. On the determination of noise parameters of low‐noise transistor devices. (4th February 2015) Authors: Seelmann‐Eggebert, M.; Aja, B.; Baldischweiler, B.; Moschetti, G.; Massler, H.; Bruch, D.; Schlechtweg, M.; Ambacher, O.; Caddemi, Alina; Caddemi, Ernesto Journal: International journal of numerical modelling Issue: Volume 28:Number 6(2015:Nov./Dec.) Page Start: 684 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗