1. Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS. (August 2014) Authors: Crozier, P. A.; Zhu, J.; Aoki, T.; Rez, P.; Bowman, W. J.; Carpenter, R.W.; Krivanek, O.L.; Dellby, N.; Lovejoy, T.C.; Egerton, R.F. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 72 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS. (August 2014) Authors: Crozier, P. A.; Zhu, J.; Aoki, T.; Rez, P.; Bowman, W. J.; Carpenter, R.W.; Krivanek, O.L.; Dellby, N.; Lovejoy, T.C.; Egerton, R.F. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 72 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Coupling of strain, stress, and oxygen non-stoichiometry in thin film Pr0.1Ce0.9O2−δ. Issue 36 (7th September 2016) Authors: Sheth, J.; Chen, D.; Kim, J. J.; Bowman, W. J.; Crozier, P. A.; Tuller, H. L.; Misture, S. T.; Zdzieszynski, S.; Sheldon, B. W.; Bishop, S. R. Journal: Nanoscale Issue: Volume 8:Issue 36(2016) Page Start: 16499 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy. (23rd September 2015) Authors: Bowman, W. J.; Darbal, A.; Kelly, M.; Rohrer, G.S.; Hernandez, C.H.; McGuinness, K.; Crozier, P.A. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 491 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy. (August 2015) Authors: Bowman, W. J.; Darbal, A.; Kelly, M.; Rohrer, G.S.; Hernandez, C.H.; McGuinness, K.; Crozier, P.A. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 491 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Nanocharacterization and Electrical Properties of Grain Boundaries in Gd/Pr Doubly-Doped Ceria. (August 2014) Authors: Bowman, W. J.; Zhu, J.; Crozier, P. A. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1894 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Nanocharacterization and Electrical Properties of Grain Boundaries in Gd/Pr Doubly-Doped Ceria. (August 2014) Authors: Bowman, W. J.; Zhu, J.; Crozier, P. A. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1894 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Oxygen Vacancies at Grain Boundaries in Doubly-Doped Ceria Determined using EELS. (August 2014) Authors: Bowman, W. J.; Zhu, J.; Hussaini, Z.; Crozier, P. A. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1926 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Oxygen Vacancies at Grain Boundaries in Doubly-Doped Ceria Determined using EELS. (August 2014) Authors: Bowman, W. J.; Zhu, J.; Hussaini, Z.; Crozier, P. A. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1926 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗