1. 3D characterization of nanowire devices with STEM based modes. (10th October 2019) Authors: Bender, Hugo; Bosch, Eric G T; Richard, Olivier; Mendez, David; Favia, Paola; Lazić, Ivan Journal: Semiconductor science and technology Issue: Volume 34:Number 11(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗