1. Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science. (August 2014) Authors: Kirkland, Angus; Kim, Judy; Warner, Jamie; Borisenko, Konstantin; Haigh, Sarah; Young, Neil; Wang, Peng; Nellist, Peter Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 930 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science. (August 2014) Authors: Kirkland, Angus; Kim, Judy; Warner, Jamie; Borisenko, Konstantin; Haigh, Sarah; Young, Neil; Wang, Peng; Nellist, Peter Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 930 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗