1. A psychometric view of technology-based assessments. Issue 3 (2nd October 2022) Authors: Liou, Gloria; Bonner, Cavan V.; Tay, Louis Journal: International journal of testing Issue: Volume 22:Issue 3/4(2022) Page Start: 216 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗