1. Atom probe tomography of nitride semiconductors. (15th April 2018) Authors: Rigutti, L.; Bonef, B.; Speck, J.; Tang, F.; Oliver, R.A. Journal: Scripta materialia Issue: Number 148(2018) Page Start: 75 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗