Author/Creator: Boit, C. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Boit, C.

1. Photon emission as a characterization tool for bipolar parasitics in FinFET technology. (September 2018)

Authors:: Beyreuther, A.; Herfurth, N.; Amini, E.; Nakamura, T.; De Wolf, I.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 273
Record Type:: Journal Article
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2. Detection of failure mechanisms in 24–40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera. (September 2018)

Authors:: Vogt, I.; Nakamura, T.; De Wolf, I.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 334
Record Type:: Journal Article
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3. IC security and quality improvement by protection of chip backside against hardware attacks. (September 2018)

Authors:: Amini, E.; Beyreuther, A.; Herfurth, N.; Steigert, A.; Muydinov, R.; Szyszka, B.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 22
Record Type:: Journal Article
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4. Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. (September 2018)

Authors:: Vogt, I.; Nakamura, T.; Motamedi, B.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 11
Record Type:: Journal Article
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5. Contactless device characterization of transistor structures in silicon using electro optical frequency mapping (EOFM). (March 2020)

Authors:: Beyreuther, A.; Herfurth, N.; Nakamura, T.; Fischer, G.G.; Keil, S.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 106(2020)
Page Start:
Record Type:: Journal Article
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6. Non-invasive soft breakdown localisation in low k dielectrics using photon emission microscopy and thermal laser stimulation. (January 2019)

Authors:: Herfurth, N.; Wu, C.; Beyreuther, A.; Nakamura, T.; De Wolf, I.; Simon-Najasek, M.; Altmann, F.; Croes, K.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 92(2019)
Page Start:: 73
Record Type:: Journal Article
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7. Contactless parametric characterization of bandgap engineering in p-type FinFETs using spectral photon emission. (January 2019)

Authors:: Beyreuther, A.; Vogt, I.; Herfurth, N.; Nakamura, T.; Fischer, G.G.; Motamedi, B.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 92(2019)
Page Start:: 143
Record Type:: Journal Article
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8. Optical interaction in active analog circuit elements. (September 2017)

Authors:: Vogt, I.; Nakamura, T.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 233
Record Type:: Journal Article
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9. Technologies for Heterogeneous Integration - Challenges and chances for fault isolation. (September 2017)

Authors:: Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 184
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗