Author/Creator: Blanck, H. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Authors:: Van de Casteele, J.; Stuhldreier, H.; Bouw, D.; Gourdon, C.; Raoult, M.; Durand, E.; Van Den Berghe, S.; Hollmer, M.; Grunwald, M.; Lambert, B.; Blanck, H.; Barnes, A.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
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Record Type:: Journal Article
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Authors:: Broas, M.; Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.; Jung, H.; Blanck, H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 541
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

Authors:: Broas, M.; Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.; Jung, H.; Blanck, H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 541
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

Authors:: Graff, A.; Simon-Najasek, M.; Altmann, F.; Kuzmik, J.; Gregušová, D.; Haščík, Š.; Jung, H.; Baur, T.; Grünenpütt, J.; Blanck, H.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 338
Record Type:: Journal Article
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Authors:: Rzin, M.; Chini, A.; De Santi, C.; Meneghini, M.; Hugger, A.; Hollmer, M.; Stieglauer, H.; Madel, M.; Splettstößer, J.; Sommer, D.; Grünenpütt, J.; Beilenhoff, K.; Blanck, H.; Chen, J.-T.; Kordina, O.; Meneghesso, G.; Zanoni, E.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 397
Record Type:: Journal Article
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