1. (Invited) Dipoles in Gate-Stack/FDSOI Structure. (16th August 2017) Authors: Reimbold, Gilles; Leroux, Charles; Suarez Segovia, Carlos; Mohamad, Blend; Kumar, Pushpendra; Garros, Xavier; Domengie, Florian; Blaise, Philippe; Ghibaudo, Gerard Journal: ECS transactions Issue: Volume 80:Number 1(2017) Page Start: 237 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Resistive Memories (RRAM) Variability: Challenges and Solutions. (20th July 2018) Authors: Molas, Gabriel; Sassine, Gilbert; Nail, Cecile; Alfaro Robayo, Diego; Nodin, Jean-François; Cagli, Carlo; Coignus, Jean; Blaise, Philippe; Nowak, Etienne Journal: ECS transactions Issue: Volume 86:Number 3(2018) Page Start: 35 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Hybrid‐RRAM toward Next Generation of Nonvolatile Memory: Coupling of Oxygen Vacancies and Metal Ions. (23rd November 2018) Authors: Sassine, Gilbert; Nail, Cécile; Blaise, Philippe; Sklenard, Benoit; Bernard, Mathieu; Gassilloud, Rémy; Marty, Aurélie; Veillerot, Marc; Vallée, Christophe; Nowak, Etienne; Molas, Gabriel Journal: Advanced Electronic Materials Issue: Volume 5:Number 2(2019) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗