1. A Binary Decision Diagram based on-line testing of digital VLSI circuits for feedback bridging faults. Issue 7 (July 2015) Authors: Biswal, Pradeep Kumar; Biswas, Santosh Journal: Microelectronics journal Issue: Volume 46:Issue 7(2015) Page Start: 598 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗