1. Advanced quantitative analysis of epitaxial SiGe composition on production wafer for logic devices. (7th November 2017) Authors: Penley, Christopher; Walker, Michael; Wilson, Michael; Billingsley, Daniel; Raviswaran, Arvind; Phillips, Shane Journal: Surface and interface analysis Issue: Volume 50:Number 1(2018) Page Start: 90 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Carrier dynamics and localization in AlInN/GaN heterostructures. Issue 5 (6th February 2013) Authors: Marcinkevičius, Saulius; Liuolia, Vytautas; Billingsley, Daniel; Shatalov, Maxim; Yang, Jinwei; Gaska, Remis; Shur, Michael S.; Krishna, Sanjay; Plis, Elena Journal: Physica status solidi Issue: Volume 10:Issue 5(2013:May) Page Start: 853 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗