Author/Creator: Bijkerk, Fred - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Bijkerk, Fred

1. Coexistence of ice clusters and liquid-like water clusters on the Ru(0001) surface. Issue 12 (10th March 2017)

Authors:: Liu, Feng; Sturm, J. M.; Lee, Chris J.; Bijkerk, Fred
Journal:: Physical chemistry chemical physics
Issue:: Volume 19:Issue 12(2017)
Page Start:: 8288
Record Type:: Journal Article
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2. High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region. Issue 1 (December 2017)

Authors:: Huang, Qiushi; Yi, Qiang; Cao, Zhaodong; Qi, Runze; Loch, Rolf; Jonnard, Philippe; Wu, Meiyi; Giglia, Angelo; Li, Wenbin; Louis, Eric; Bijkerk, Fred; Zhang, Zhong; Wang, Zhanshan
Journal:: Scientific reports
Issue:: Volume 7:Issue 1(2017)
Page Start:: 1
Record Type:: Journal Article
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3. Hydrogen etch resistance of aluminium oxide passivated graphitic layers. (23rd September 2021)

Authors:: Kizir, Seda; van den Beld, Wesley T E; Verbakel, Jort D; Pushkarev, Roman; Houweling, ZSilvester; van de Kruijs, Robbert W E; Benschop, Jos P H; Bijkerk, Fred
Journal:: Journal of physics
Issue:: Volume 54:Number 50(2021)
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Record Type:: Journal Article
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4. Hydrogen etch resistance of aluminium oxide passivated graphitic layers. (23rd September 2021)

Authors:: Kizir, Seda; van den Beld, Wesley T E; Verbakel, Jort D; Pushkarev, Roman; Houweling, Z Silvester; van de Kruijs, Robbert W E; Benschop, Jos P H; Bijkerk, Fred
Journal:: Journal of physics
Issue:: Volume 54:Number 50(2021)
Page Start:
Record Type:: Journal Article
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5. Hysteresis, Loss and Nonlinearity in Epitaxial PbZr0.55Ti0.45O3 Films: A Polarization Rotation Model. (23rd September 2020)

Authors:: Lucke, Philip; Bayraktar, Muharrem; Birkhölzer, Yorick A.; Nematollahi, Mohammadreza; Yakshin, Andrey; Rijnders, Guus; Bijkerk, Fred; Houwman, Evert P.
Journal:: Advanced functional materials
Issue:: Volume 30:Number 52(2020)
Page Start:: n/a
Record Type:: Journal Article
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6. Influence of DC Bias on the Hysteresis, Loss, and Nonlinearity of Epitaxial PbZr0.55Ti0.45O3 Films. (27th May 2021)

Authors:: Lucke, Philip; Bayraktar, Muharrem; Schukkink, Niels; Yakshin, Andrey E.; Rijnders, Guus; Bijkerk, Fred; Houwman, Evert P.
Journal:: Advanced Electronic Materials
Issue:: Volume 7:Number 8(2021)
Page Start:: n/a
Record Type:: Journal Article
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7. Mo/Si multilayer‐coated amplitude‐division beam splitters for XUV radiation sources. (8th February 2013)

Authors:: Sobierajski, Ryszard; Loch, Rolf Antonie; van de Kruijs, Robbert W. E.; Louis, Eric; von Blanckenhagen, Gisela; Gullikson, Eric M.; Siewert, Frank; Wawro, Andrzej; Bijkerk, Fred
Journal:: Journal of synchrotron radiation
Issue:: Volume 20:Part 2(2013)
Page Start:: 249
Record Type:: Journal Article
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8. Reconstruction of interfaces of periodic multilayers from X‐ray reflectivity using a free‐form approach. Issue 4 (20th July 2016)

Authors:: Zameshin, Andrey; Makhotkin, Igor A.; Yakunin, Sergey N.; van de Kruijs, Robbert W. E.; Yakshin, Andrey E.; Bijkerk, Fred
Journal:: Journal of applied crystallography
Issue:: Volume 49:Issue 4(2016)
Page Start:: 1300
Record Type:: Journal Article
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9. The role of pinhole structures in Mo thin films on multi-layer graphene synthesis. (12th March 2020)

Authors:: Kizir, Seda; van den Beld, Wesley; Schurink, Bart; van de Kruijs, Robbert; Benschop, Jos; Bijkerk, Fred
Journal:: JPhys materials
Issue:: Volume 3:Number 2(2020)
Page Start:
Record Type:: Journal Article
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