1. Adversarial Detection of Flash Malware: Limitations and Open Issues. Issue 96 (September 2020) Authors: Maiorca, Davide; Demontis, Ambra; Biggio, Battista; Roli, Fabio; Giacinto, Giorgio Journal: Computers & security Issue: Issue 96(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Backdoor smoothing: Demystifying backdoor attacks on deep neural networks. Issue 120 (September 2022) Authors: Grosse, Kathrin; Lee, Taesung; Biggio, Battista; Park, Youngja; Backes, Michael; Molloy, Ian Journal: Computers & security Issue: Issue 120(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. ImageNet-Patch: A dataset for benchmarking machine learning robustness against adversarial patches. (February 2023) Authors: Pintor, Maura; Angioni, Daniele; Sotgiu, Angelo; Demetrio, Luca; Demontis, Ambra; Biggio, Battista; Roli, Fabio Journal: Pattern recognition Issue: Volume 134(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Practical Evaluation of Poisoning Attacks on Online Anomaly Detectors in Industrial Control Systems. Issue 122 (November 2022) Authors: Kravchik, Moshe; Demetrio, Luca; Biggio, Battista; Shabtai, Asaf Journal: Computers & security Issue: Issue 122(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Structural, syntactic, and statistical pattern recognition : joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29-December 2, 2016, Proceedings /: joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29-December 2, 2016, Proceedings. (2016) Editors: Robles-Kelly, Antonio A; Loog, Marco; Biggio, Battista; Escolano, Francisco; Wilson, Richard Other Names: International Workshop on Structural and Syntactic Pattern Recognition; International Workshop on Statistical Techniques in Pattern Recognition Record Type: Book Extent: 1 online resource (xiii, 588 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings /: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings. ([2018]) Editors: Xiao, Bai; Hancock, Edwin R; Ho, Tin Kam; Wilson, Richard C; Biggio, Battista; Robles-Kelly, Antonio Other Names: S+SSPR (Workshop) Record Type: Book Extent: 1 online resource (xiii, 524 pages), 134 illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. The Threat of Offensive AI to Organizations. Issue 124 (January 2023) Authors: Mirsky, Yisroel; Demontis, Ambra; Kotak, Jaidip; Shankar, Ram; Gelei, Deng; Yang, Liu; Zhang, Xiangyu; Pintor, Maura; Lee, Wenke; Elovici, Yuval; Biggio, Battista Journal: Computers & security Issue: Issue 124(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Wild patterns: Ten years after the rise of adversarial machine learning. (December 2018) Authors: Biggio, Battista; Roli, Fabio Journal: Pattern recognition Issue: Volume 84(2018:Dec.) Page Start: 317 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗