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You searched for: Author/Creator Bieda, M.- Bieda, M. [remove] 3
- Electronic journals 2
- 616.9940642 1
- 620.11 1
- 620.1105 1
- AFM atomic force microscopy -- BF bright field -- BSE backscattered electron -- CDRX continuous dynamic recrystallization -- CG coarse-grained -- CI confidence index -- DF dark field -- EBSD electron backscatter diffraction -- ECAP equal channel angular pressing -- ED extrusion direction -- EDS energy dispersive X-ray spectroscopy -- FG fine-grained -- HAADF high-angle angular dark field -- HAGB high-angle grain boundary -- HE hydrostatic extrusion -- HPT high-pressure torsion -- LAGB low-angle grain boundary -- LCS longitudinal cross-section -- MAO micro-arc oxidation -- RS rotary swaging -- SAED selected area electron diffraction -- SE secondary electron -- SEM scanning electron microscopy -- SPD severe plastic deformation -- STEM scanning transmission electron microscopy -- TCS transverse cross-section -- TEM transmission electron microscopy -- UTS ultimate tensile strength -- XRD X-ray powder diffraction 1
- Cancérologie -- Périodiques 1
- Conception technique -- Périodiques 1
- Engineering design -- Periodicals 1
- Materials -- Periodicals 1
- Materials science 1