1. The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity. (August 2019) Authors: Trimby, Pat; Bewick, Angus; Abou-Ras, Daniel; Caprioglio, Pietro; Neher, Dieter; Otter, Laura Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 2394 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗