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- Berens, Judith [remove] 2
- 333.79 1
- 4H-SiC -- MOSFET -- NO -- NH3 -- N2 -- Post oxidation annealing sep trap assisted tunnelling -- Reliability -- Gate oxide tunnelling -- Breakdown 1
- 621.3815 1
- Appareils électroniques -- Fiabilité -- Périodiques 1
- Electronic apparatus and appliances -- Reliability 1
- Electronic apparatus and appliances -- Reliability -- Periodicals 1
- Miniature electronic equipment 1
- Miniature electronic equipment -- Periodicals 1
- Periodicals 1
- Power resources -- Periodicals 1