1. Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors. Issue 8 (22nd March 2022) Authors: Brouillard, Mélanie; Bercu, Nicolas; Zschieschang, Ute; Simonetti, Olivier; Mittapalli, Rakesh; Klauk, Hagen; Giraudet, Louis Journal: Nanoscale advances Issue: Volume 4:Issue 8(2022) Page Start: 2018 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗