1. Characterization of Low Drop-Out during ageing and design for yield. (September 2017) Authors: Lajmi, R.; Cacho, F.; Lauga Larroze, E.; Bourdel, S.; Benech, P.; Huard, V.; Federspiel, X. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 92 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗