1. D+: software for high‐resolution hierarchical modeling of solution X‐ray scattering from complex structures. Issue 1 (1st February 2019) Authors: Ginsburg, Avi; Ben-Nun, Tal; Asor, Roi; Shemesh, Asaf; Fink, Lea; Tekoah, Roee; Levartovsky, Yehonatan; Khaykelson, Daniel; Dharan, Raviv; Fellig, Amos; Raviv, Uri Journal: Journal of applied crystallography Issue: Volume 52:Issue 1(2019) Page Start: 219 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗