1. Traceable Quantitative Raman Microscopy and X-ray Fluorescence Analysis as Nondestructive Methods for the Characterization of Cu(In, Ga)Se2 Absorber Films. Issue 2 (February 2016) Authors: Zakel, Sabine; Pollakowski, Beatrix; Streeck, Cornelia; Wundrack, Stefan; Weber, Alfons; Brunken, Stefan; Mainz, Roland; Beckhoff, Burckhardt; Stosch, Rainer Journal: Applied spectroscopy Issue: Volume 70:Issue 2(2016) Page Start: 279 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗