1. News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy. (August 2019) Authors: Niculae, Adrian; Barros, Thiago; Bechteler, Alois; Lackner, Robert; Hermenau, Kathrin; Heizinger, Klaus; Mönninghoff, Tristan; Soltau, Heike; Strüder, Lothar Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 516 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium. (August 2019) Authors: Niculae, Adrian; Barros, Thiago; Bechteler, Alois; Hermenau, Kathrin; Heinzinger, Klaus; Liebel, Andreas; Soltau, Heike; Strüder, Lothar Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1768 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗