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Author/Creator Bauer, Friedhelm

1. The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. (March 2016)

Authors:
Rahimo, Munaf; Richter, Frank; Fischer, Fabian; Vemulapati, Umamaheswara; Kopta, Arnost; Corvasce, Chiara; Geissmann, Silvan; Bellini, Marco; Bayer, Martin; Bauer, Friedhelm
Journal:
Microelectronics and reliability
Issue:
Volume 58(2016)
Page Start:
51
Record Type:
Journal Article
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