1. Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. (23rd June 2014) Authors: Hong, Shin; Staats, Matt; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg; Baudry, Benoit; Orso, Alessandro Journal: Software testing, verification & reliability Issue: Volume 25:Number 4(2015:Oct.) Page Start: 334 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Towards an automation of the mutation analysis dedicated to model transformation. (25th April 2014) Authors: Aranega, Vincent; Mottu, Jean‐Marie; Etien, Anne; Degueule, Thomas; Baudry, Benoit; Dekeyser, Jean‐Luc Other Names: Jia Yue guestEditor.; Merayo Mercedes guestEditor.; Harman Mark guestEditor. Journal: Software testing, verification & reliability Issue: Volume 25:Number 5/7(2015) Page Start: 653 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗