Author/Creator: Basol, Bulent M - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Basol, Bulent M

1. (Invited) Differential Hall Effect Metrology (DHEM) Sub-Nm Profiling and Its Application to Dopant Activation in n-Type Ge. (24th April 2020)

Authors:: Ramesh, Pranav; Saraswat, Krishna C.; Joshi, Abhijeet; Basol, Bulent M; Wang, Larry; Buyuklimanli, Temel
Journal:: ECS transactions
Issue:: Volume 97:Number 3(2020)
Page Start:: 75
Record Type:: Journal Article
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2. Sub-nm Near-Surface Activation Profiling for Highly Doped Si and Ge Using Differential Hall Effect Metrology (DHEM). (8th September 2020)

Authors:: Joshi, Abhijeet; Basol, Bulent M
Journal:: ECS transactions
Issue:: Volume 98:Number 5(2020)
Page Start:: 405
Record Type:: Journal Article
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