1. Development of nano‐roughness under SIMS ion sputtering of germanium surfaces. (18th April 2012) Authors: Iacob, E.; Demenev, E.; Giubertoni, D.; Barozzi, M.; Gennaro, S.; Bersani, M. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 409 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Fabrication of advanced targets for laser driven nuclear fusion reactions through standard microelectronics technology approaches. (2nd October 2017) Authors: Picciotto, A.; Crivellari, M.; Bellutti, P.; Barozzi, M.; Kucharik, M.; Krasa, J.; Swidlosky, A.; Malinowska, A.; Velyhan, A.; Ullschmied, J.; Margarone, D. Journal: Journal of instrumentation Issue: Volume 12:Number 10(2017:Oct.) Page Start: P10001 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Low and high‐cycle fatigue properties of an ultrahigh‐strength TRIP bainitic steel. Issue 9 (10th February 2017) Authors: Benedetti, M.; Fontanari, V.; Barozzi, M.; Gabellone, D.; Tedesco, M. M.; Plano, S. Journal: Fatigue & fracture of engineering materials & structures Issue: Volume 40:Issue 9(2017:Sep.) Page Start: 1459 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Phosphorous Diffusion in N2+-Implanted Germanium during Flash Lamp Annealing: Influence of Nitrogen on Ge Substrate Damage and Capping Layer Engineering. (1st January 2017) Authors: Skarlatos, D.; Ioannou-Sougleridis, V.; Barozzi, M.; Pepponi, G.; Velessiotis, D.; Skoulikidou, M. C.; Vouroutzis, N. Z.; Papagelis, K.; Dimitrakis, P.; Thomidis, C.; Colombeau, B. Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 7(2017) Page Start: P418 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Phosphorous Diffusion in N2+-Implanted Germanium during Flash Lamp Annealing: Influence of Nitrogen on Ge Substrate Damage and Capping Layer Engineering. (25th May 2017) Authors: Skarlatos, D.; Ioannou-Sougleridis, V.; Barozzi, M.; Pepponi, G.; Velessiotis, D.; Skoulikidou, M. C.; Vouroutzis, N. Z.; Papagelis, K.; Dimitrakis, P.; Thomidis, C.; Colombeau, B. Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 7(2017) Page Start: P418 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Post-metallization annealing and photolithography effects in p-type Ge/Al2O3/Al MOS structures. (1st April 2022) Authors: Ioannou-Sougleridis, V.; Alafakis, S.; Pécz, B.; Velessiotis, D.; Vouroutzis, N. Z.; Ladas, S.; Barozzi, M.; Pepponi, G.; Skarlatos, D. Journal: ECS journal of solid state science and technology Issue: Volume 11:Number 4(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Strong Diffusion Suppression of Low Energy–Implanted Phosphorous in Germanium by N2 Co-Implantation. (1st January 2015) Authors: Thomidis, C.; Barozzi, M.; Bersani, M.; Ioannou-Sougleridis, V.; Vouroutzis, N. Z.; Colombeau, B.; Skarlatos, D. Journal: ECS Solid State Letters Issue: Volume 4:Number 6(2015) Page Start: P47 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Strong Diffusion Suppression of Low Energy–Implanted Phosphorous in Germanium by N2 Co-Implantation. (21st April 2015) Authors: Thomidis, C.; Barozzi, M.; Bersani, M.; Ioannou-Sougleridis, V.; Vouroutzis, N. Z.; Colombeau, B.; Skarlatos, D. Journal: ECS Solid State Letters Issue: Volume 4:Number 6(2015) Page Start: P47 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Structural analysis and depth profiling of nanometric SiO2/SRO multilayers. (27th March 2012) Authors: Barozzi, M.; Gennaro, S.; Bersani, M.; Vanzetti, L.; Jestin, Y.; Pucker, G.; Milita, S.; Balboni, R. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 373 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM. (4th May 2012) Authors: Barozzi, M.; Iacob, E.; van den, J.A.; Reading, M.A.; Adelmann, C.; Popovici, M.; Tielens, H; Bersani, M. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 394 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗