1. Hard-switching reliability studies of 1200 V vertical GaN PiN diodes. (28th September 2018) Authors: Slobodyan, O.; Smith, T.; Flicker, J.; Sandoval, S.; Matthews, C.; van Heukelom, M.; Kaplar, R.; Atcitty, S. Journal: MRS communications Issue: Volume 8:Number 4(2018) Page Start: 1413 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗