1. Asymmetric skew X‐ray diffraction at fixed incidence angle: application to semiconductor nano‐objects. Issue 3 (23rd May 2016) Authors: Grigoriev, D.; Lazarev, S.; Schroth, P.; Minkevich, A.A.; Köhl, M.; Slobodskyy, T.; Helfrich, M.; Schaadt, D.M.; Aschenbrenner, T.; Hommel, D.; Baumbach, T. Journal: Journal of applied crystallography Issue: Volume 49:Issue 3(2016) Page Start: 961 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Blue lasing and strong coupling in ZnSe monolithic microcavities. Issue 9 (7th June 2013) Authors: Sebald, K.; Seyfried, M.; Klembt, S.; Kruse, C.; Aschenbrenner, T.; Hommel, D.; Bley, S.; Rosenauer, A.; Gutowski, J.; Ulrich, Sven M.; Jetter, Michael; Michler, Peter Journal: Physica status solidi Issue: Volume 10:Issue 9(2013:Sep.) Page Start: 1230 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗