1. A high-speed and triple-node-upset recovery latch with heterogeneous interconnection. (December 2021) Authors: Huang, Zhengfeng; Wang, Hao; Ang, Yang; Liang, Huaguo; Ouyang, Yiming; Ni, Tianming Journal: Microelectronics journal Issue: Volume 118(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗