1. In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB. (August 2021) Authors: Schwalb, Chistian; Hütner, Johanna; Frerichs, Hajo; Wolff, Marion; Winkler, Robert; Andany, Santiago; Hosemann, Peter; Hlawacek, Gregor; Fantner, Georg; Plank, Harald Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1020 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗