1. Photobleaching reduction in modulated super-resolution microscopy. (16th October 2020) Authors: Ghithan, Jafar H; Noel, Jennifer M; Roussel, Thomas J; McCall, Maureen A; Alphenaar, Bruce W; Mendes, Sergio B Journal: Microscopy Issue: Volume 70:Number 3(2021) Page Start: 278 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs). (9th December 2016) Authors: Arutt, Charles N; Alles, Michael L; Liao, Wenjun; Gong, Huiqi; Davidson, Jim L; Schrimpf, Ronald D; Reed, Robert A; Weller, Robert A; Bolotin, Kirill; Nicholl, Ryan; Pham, Thang Toan; Zettl, Alex; Qingyang, Du; Hu, Juejun; Li, Mo; Alphenaar, Bruce W; Lin, Ji-Tzuoh; Shurva, Pranoy Deb; McNamara, S... Journal: Semiconductor science and technology Issue: Volume 32:Number 1(2017:Jan.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Wrap around field plate technique for GaN Schottky barrier diodes. Issue 1736 (19th December 2014) Authors: Kolli, Sowmya; Hickman, Robert; Alphenaar, Bruce W Editors: Kaplar, R.; Meneghesso, G.; Ozpineci, B.; Takeuchi, T. Journal: MRS proceedings Issue: Issue 1736:(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Wrap around field plate technique for GaN Schottky barrier diodes. Issue 1736 (19th December 2014) Authors: Kaplar, R.; Meneghesso, G.; Ozpineci, B.; Takeuchi, T.; Kolli, Sowmya; Hickman, Robert; Alphenaar, Bruce W Journal: MRS proceedings Issue: Issue 1736:(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗