1. Compact low‐loss microstrip diplexer for RF energy harvesting. Issue 8 (1st April 2017) Authors: Bui, D.H.N.; Vuong, T.P.; Allard, B.; Verdier, J.; Benech, P. Journal: Electronics letters Issue: Volume 53:Issue 8(2017) Page Start: 552 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Continuous‐time digital filtering analogue‐to‐digital converter. Issue 6 (1st March 2016) Authors: Ratiu, A.; Morche, D.; Allard, B.; Lin‐Shi, X.; Verdier, J. Journal: Electronics letters Issue: Volume 52:Issue 6(2016) Page Start: 432 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Immuno-oncology-101: overview of major concepts and translational perspectives. (October 2018) Authors: Allard, B.; Aspeslagh, S.; Garaud, S.; Dupont, F.A.; Solinas, C.; Kok, M.; Routy, B.; Sotiriou, C.; Stagg, J.; Buisseret, L. Journal: Seminars in cancer biology Issue: Volume 52(2018)Part 2 Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Model for clipping‐induced timing error of bandwidth‐limited comparators. Issue 8 (1st April 2013) Authors: Ritter, P.; Le Tual, S.; Allard, B.; Möller, M. Journal: Electronics letters Issue: Volume 49:Issue 8(2013) Page Start: 531 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. (September 2016) Authors: Viale, B.; Fer, M.; Courau, L.; Galy, P.; Allard, B. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 101 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. (September 2016) Authors: Viale, B.; Fer, M.; Courau, L.; Galy, P.; Allard, B. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 101 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Second Toe Systolic Pressure Measurements are Valid Substitutes for First Toe Systolic Pressure Measurements in Diabetic Patients: A Prospective Study. Issue 1 (January 2015) Authors: Bhamidipaty, V.; Dean, A.; Yap, S.L.; Firth, J.; Barron, M.; Allard, B.; Chan, S.T.F. Journal: European journal of vascular and endovascular surgery Issue: Volume 49:Issue 1(2015:Jan.) Page Start: 77 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Second Toe Systolic Pressure Measurements are Valid Substitutes for First Toe Systolic Pressure Measurements in Diabetic Patients: A Prospective Study. Issue 1 (January 2015) Authors: Bhamidipaty, V.; Dean, A.; Yap, S.L.; Firth, J.; Barron, M.; Allard, B.; Chan, S.T.F. Journal: European journal of vascular and endovascular surgery Issue: Volume 49:Issue 1(2015:Jan.) Page Start: 77 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. The synergetic effects of high temperature gate bias and total ionization dose on 1.2 kV SiC devices. (September 2018) Authors: Zhang, T.; Allard, B.; Bi, J. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 631 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗