1. (Invited) Advanced Transistors for High Frequency Applications. (24th April 2020) Authors: Parvais, Bertrand; Peralagu, Uthayasankaran; Vais, Abhitosh; Alian, AliReza; Witters, Liesbet; Mols, Yves; Walke, Amey; Ingels, Mark; Yu, Hao; Putcha, Vamsi; Khaled, Ahmad; Rodriguez, Raul; Sibaja-Hernandez, Arturo; Yadav, Sachin; ElKashlan, Rana; Baryshnikova, Marina; Mannaert, Geert; Alcotte, R... Journal: ECS transactions Issue: Volume 97:Number 5(2020) Page Start: 27 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Electrical Activity of Extended Defects in III-V Semiconductors. (3rd July 2019) Authors: Simoen, Eddy Roger; Hsu, P.-C.; Mols, Yves; Kunert, Bernardette; Langer, Robert; Merckling, Clement; Alian, AliReza; Waldron, Niamh; Eneman, Geert; Collaert, Nadine; Heyns, Marc; Claeys, Cor Journal: ECS transactions Issue: Volume 92:Number 4(2019) Page Start: 21 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) On the Electrical Activity of Extended Defects in High-Mobility Channel Materials. (14th September 2015) Authors: Simoen, Eddy; Eneman, Geert; Hikavyy, Andriy Yakovitch; Loo, Roger; Gupta, Somya; Merckling, Clement; Alian, AliReza; Schulze, Andreas; Caymax, Matty; Langer, Robert; Barla, Kathy; Claeys, Cor Journal: ECS transactions Issue: Volume 69:Number 10(2015) Page Start: 119 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. (Invited) The Assessment of Border Traps in High-Mobility Channel Materials. (8th September 2015) Authors: Simoen, Eddy; Alian, AliReza; Arimura, Hiroaki; Lin, D; Mertens, Hans; Mitard, Jerome; Sioncke, Sonia; Fang, Wen; Luo, Jun; Zhao, Chao; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Claeys, Cor Journal: ECS transactions Issue: Volume 69:Number 5(2015) Page Start: 205 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. (Plenary) The Revival of Compound Semiconductors and How They Will Change the World in a 5G/6G Era. (8th September 2020) Authors: Collaert, Nadine; Alian, AliReza; Banerjee, Aritra; Chauhan, Vikas; ElKashlan, Rana Y.; Hsu, Brent; Ingels, Mark; Khaled, Ahmad; Kodandarama, Komal Vondkar; Kunert, Bernardette; Mols, Yves; Peralagu, Uthayasankaran; Putcha, Vamsi; Rodriguez, Raul; Sibaja-Hernandez, Arturo; Simoen, Eddy; Vais, Abh... Journal: ECS transactions Issue: Volume 98:Number 5(2020) Page Start: 15 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. The impact of extended defects on the generation and recombination lifetime in n type In.53Ga.47As. (12th September 2019) Authors: Hsu, Po-Chun (Brent); Simoen, Eddy; Merckling, Clement; Eneman, Geert; Mols, Yves; Han, Han; Alian, AliReza; Collaert, Nadine; Heyns, Marc Journal: Journal of physics Issue: Volume 52:Number 48(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗