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Author/Creator Al-Hassan, Ali

1. Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X‐ray diffraction. (9th August 2017)

Authors:
Davtyan, Arman; Lehmann, Sebastian; Kriegner, Dominik; Zamani, Reza R.; Dick, Kimberly A.; Bahrami, Danial; Al-Hassan, Ali; Leake, Steven J.; Pietsch, Ullrich; Holý, Václav
Journal:
Journal of synchrotron radiation
Issue:
Volume 24:Part 5(2017)
Page Start:
981
Record Type:
Journal Article
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2. Threefold rotational symmetry in hexagonally shaped core–shell (In, Ga)As/GaAs nanowires revealed by coherent X‐ray diffraction imaging. Issue 3 (13th April 2017)

Authors:
Davtyan, Arman; Krause, Thilo; Kriegner, Dominik; Al-Hassan, Ali; Bahrami, Danial; Mostafavi Kashani, Seyed Mohammad; Lewis, Ryan B.; Küpers, Hanno; Tahraoui, Abbes; Geelhaar, Lutz; Hanke, Michael; Leake, Steven John; Loffeld, Otmar; Pietsch, Ullrich
Journal:
Journal of applied crystallography
Issue:
Volume 50:Issue 3(2017)
Page Start:
673
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗