1. Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy. (August 2019) Authors: Addiego, Christopher; Gao, Wenpei; Pan, Xiaoqing Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 18 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Structures and electronic properties of domain walls in BiFeO3 thin films. Issue 4 (10th July 2019) Authors: Huyan, Huaixun; Li, Linze; Addiego, Christopher; Gao, Wenpei; Pan, Xiaoqing Journal: National science review Issue: Volume 6:Issue 4(2019) Page Start: 669 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗