1. Numerical simulation of bias and photo stress on indium–gallium–zinc-oxide thin film transistors. (October 2015) Authors: Adaika, M.; Meftah, Af.; Sengouga, N.; Henini, M. Journal: Vacuum Issue: Volume 120(2015)Part B Page Start: 59 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗