1. On recoverable behavior of PBTI in AlGaN/GaN MOS-HEMT. (June 2017) Authors: Acurio, E.; Crupi, F.; Magnone, P.; Trojman, L.; Meneghesso, G.; Iucolano, F. Journal: Solid-state electronics Issue: Volume 132(2017) Page Start: 49 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗