1. Advanced temperature dependent statistical analysis of forming voltage distributions for three different HfO2-based RRAM technologies. (February 2021) Authors: Pérez, Eduardo; Maldonado, David; Acal, Christian; Ruiz-Castro, Juan Eloy; Aguilera, Ana María; Jiménez-Molinos, Francisco; Roldán, Juan Bautista; Wenger, Christian Journal: Solid-state electronics Issue: Volume 176(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗